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Electron Charging and Discharging Effects of Tungsten Nanocrystals Embedded in Silicon Dioxide for Low-Voltage Nonvolatile Memory Technology

✍ Scribed by Chang, T. C.; Liu, P. T.; Yan, S. T.; Sze, S. M.


Book ID
125424618
Publisher
The Electrochemical Society
Year
2005
Tongue
English
Weight
217 KB
Volume
8
Category
Article
ISSN
1099-0062

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