Electron channeling and EBIC studies of edge-supported pulling silicon sheets

✍ Scribed by Tsuo, Y.S.; Hurd, J.L.; Matson, R.J.; Ciszek, T.F.

• Book ID: 114594753
• Publisher: IEEE
• Year: 1984
• Tongue: English
• Weight: 1012 KB
• Volume: 31
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/t-ed.1984.21577