Electron-beam-induced current microcharacterization of fabrication defects in hydrogenated amorphous silicon solar cells

Electron-beam-induced current study of h

Electron-beam-induced current study of hydrogen passivation on grain boundaries in multicrystalline silicon: Influence of GB character and impurity contamination

✍ Jun Chen; Deren Yang; Zhenqiang Xi; Takashi Sekiguchi 📂 Article 📅 2005 🏛 Elsevier Science 🌐 English ⚖ 394 KB

The impacts of grain boundary (GB) character and impurity contamination level on the hydrogen passivation of GBs in multicrystalline silicon (mc-Si) were studied by means of an electron-beam-induced current (EBIC) technique. In mc-Si with a low contamination of Fe, the 300 K EBIC contrast of all kin