๐”– Bobbio Scriptorium
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Electron beam induced current in biased MOS transistors

โœ Scribed by E.K. Hieke; J. Tihanyi


Publisher
Elsevier Science
Year
1979
Tongue
English
Weight
335 KB
Volume
22
Category
Article
ISSN
0038-1101

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A new electron-beam-induced current (EBIC) apparatus for studying charge carrier recombination at extended defects in semiconductors is described. It employs computer-automated measurement and control equipment to acquire high resolution beam-induced current images using a conventional scanning elec