Electron attachment rate constant measurement by photoemission electron attachment ion mobility spectrometry (PE-EA-IMS)

✍ Scribed by Desheng Su; Wenqi Niu; Sheng Liu; Chengyin Shen; Chaoqun Huang; Hongmei Wang; Haihe Jiang; Yannan Chu

• Book ID: 118498215
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 712 KB
• Volume: 81
• Category: Article
• ISSN: 0969-806X
• DOI: 10.1016/j.radphyschem.2012.07.005