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Electron and hole traps in X-ray irradiated Y 2 SiO 5 and Lu 2 SiO 5 crystals

✍ Scribed by Kärner, T.; Laguta, V.; Nikl, M.; Zazubovich, S.


Book ID
126812206
Publisher
John Wiley and Sons
Year
2013
Tongue
English
Weight
640 KB
Volume
251
Category
Article
ISSN
0370-1972

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