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Electron and hole mobility in silicon at large operating temperatures. I. Bulk mobility

โœ Scribed by Reggiani, S.; Valdinoci, M.; Colalongo, L.; Rudan, M.; Baccarani, G.; Stricker, A.D.; Illien, F.; Felber, N.; Fichtner, W.; Zullino, L.


Book ID
114539026
Publisher
IEEE
Year
2002
Tongue
English
Weight
228 KB
Volume
49
Category
Article
ISSN
0018-9383

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