a), M. Lion (a), R. Heitz (a), D. Bimberg (a), P. Brunkov (b), B. Volovik (b), S. G. Konnikov (b), A. R. Kovsh (b), and V. M. Ustinov (b)
Electron and hole levels of InAs quantum dots in a GaAs matrix
โ Scribed by M. Henini; P.N. Brounkov; A. Polimeni; S.T. Stoddart; P.C. Main; L. Eaves; A.R. Kovsh; Yu.G. Musikhin; S.G. Konnikov
- Publisher
- Elsevier Science
- Year
- 1999
- Tongue
- English
- Weight
- 110 KB
- Volume
- 25
- Category
- Article
- ISSN
- 0749-6036
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โฆ Synopsis
Photoluminescence, capacitance-voltage and transmission electron microscopy studies have been carried out on structures containing a sheet of a self-assembled InAs quantum dots formed in GaAs matrices after the deposition of a 1.7 ML of InAs at 480 โข C. The use of n-and p-type GaAs matrices allows us to study separately electron and hole levels in the quantum dots by the capacitance-voltage technique. From analysis of photoluminescence and capacitance-voltage measurements it follows that the quantum dots have electron levels 80 meV below the bottom of the GaAs conduction band and two heavy-hole levels at 100 meV and 170 meV above the top of the GaAs valence band.
๐ SIMILAR VOLUMES
We studied the formation of InAs islands in holes defined by electron-beam lithography on GaAs substrates. The islands grew selectively in the holes, with one to nine islands per hole. The number of islands depends simply on the hole diameter, filling the holes at a constant effective two-dimensiona