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Electron accumulation at InN/AlN and InN/GaN interfaces

✍ Scribed by T. D. Veal; L. F. J. Piper; I. Mahboob; Hai Lu; W. J. Schaff; C. F. McConville

Book ID: 104557485
Publisher: John Wiley and Sons
Year: 2005
Tongue: English
Weight: 263 KB
Volume: 2
Category: Article
ISSN: 1862-6351
DOI: 10.1002/pssc.200461418

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