Electromigration properties of multigrain aluminum thin film conductors as influenced by grain boundary structure

✍ Scribed by Kononenko, O. V.; Matveev, V. N.; Field, D. P.

• Book ID: 126559774
• Publisher: Cambridge University Press
• Year: 2001
• Tongue: English
• Weight: 422 KB
• Volume: 16
• Category: Article
• ISSN: 0884-2914
• DOI: 10.1557/JMR.2001.0289