𝔖 Bobbio Scriptorium

✦ LIBER ✦

Electromigration in integrated circuits : I. A. Blech and E. S. Meieran, Proc. 1970 Ann. Symp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3–5 February (1970), p. 243

Publisher: Elsevier Science
Year: 1970
Tongue: English
Weight: 112 KB
Volume: 9
Category: Article
ISSN: 0026-2714
DOI: 10.1016/0026-2714(70)90139-3

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Systems effectiveness evaluations : S. L

Systems effectiveness evaluations : S. Levine, Proc. 1970 Ann. Symp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3–5 February (1970), p. 75

📂 Article 📅 1970 🏛 Elsevier Science 🌐 English ⚖ 112 KB

A redundancy analysis technique : A. E.

A redundancy analysis technique : A. E. Spindler, Proc. 1970 Ann. Symp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3–5 February (1970), p. 181

📂 Article 📅 1970 🏛 Elsevier Science 🌐 English ⚖ 111 KB

Determining optimum reliability programs

Determining optimum reliability programs : I. Doshay, Proc. 1970 Ann. Symp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3–5 February (1970), p. 43

📂 Article 📅 1970 🏛 Elsevier Science 🌐 English ⚖ 114 KB

Reliability physics—An assessment : J. V

Reliability physics—An assessment : J. Vaccaro, Proc. 1970 Ann. Symp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3–5 February (1970), p. 348

📂 Article 📅 1970 🏛 Elsevier Science 🌐 English ⚖ 102 KB

Circuit design selection—A reliability f

Circuit design selection—A reliability factor : B. L. Retterer, Proc. 1970 Ann. Symp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3–5 February (1970), p. 192

📂 Article 📅 1970 🏛 Elsevier Science 🌐 English ⚖ 111 KB

Correlation of reliability performance m

Correlation of reliability performance measurements : J. E. Anderson, Proc. 1970 Ann. Symp. Reliab., Los Angeles. IEEE Cat. No. 70 C 2-R, 3–5 February (1970), p. 206

📂 Article 📅 1970 🏛 Elsevier Science 🌐 English ⚖ 110 KB