Electromigration behaviour of SiO2-covered, large-grained, narrow AlSi lines with ohmic contacts

✍ Scribed by H.-U. Schreiber

• Book ID: 107856793
• Publisher: Elsevier Science
• Year: 1986
• Tongue: English
• Weight: 575 KB
• Volume: 29
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/0038-1101(86)90060-2