Electromechanical properties of Ba(Ti1-xZrx)O3thin films
✍ Scribed by S. Halder; P. Gerber; T. Schneller; R. Waser
- Publisher
- Springer
- Year
- 2005
- Tongue
- English
- Weight
- 348 KB
- Volume
- 81
- Category
- Article
- ISSN
- 1432-0630
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## Sol-gel method A B S T R A C T Ba(Ti 1Àx ,Ni x )O 3 thin films were prepared on fused quartz substrates by a sol-gel process. X-ray diffraction and Raman scattering measurements showed that the films are of pseudo-cubic perovskite structure with random orientation and the change of lattice cons
## Abstract Perovskite‐structured Ba~0.90~Ca~0.10~(Ti~1−__x__~Zr~__x__~)O~3~ ceramics were prepared in this work and subsequently studied in terms of composition‐dependent dielectric and high‐resolution long‐range order structural properties from 30 to 450 K. The dielectric response of these materi