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Electrodynamic theory for near-field microwave microscopy of plane-layered structures and its application to metrology of thin dielectric films

✍ Scribed by A. N. Reznik; V. V. Talanov; I. A. Shereshevsky; N. K. Vdovicheva


Book ID
111501219
Publisher
Allerton Press Inc
Year
2009
Tongue
English
Weight
195 KB
Volume
73
Category
Article
ISSN
1062-8738

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