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Electrode roughness and interfacial mixing effects on the tunnel junction thermal stability

✍ Scribed by Cardoso, S.; Freitas, P. P.; Zhang, Z. G.; Wei, P.; Barradas, N.; Soares, J. C.


Book ID
126179928
Publisher
American Institute of Physics
Year
2001
Tongue
English
Weight
321 KB
Volume
89
Category
Article
ISSN
0021-8979

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