Electrode kinetics of Cu–SiO[sub 2]-based resistive switching cells: Overcoming the voltage-time dilemma of electrochemical metallization memories

✍ Scribed by Schindler, C.; Staikov, G.; Waser, R.

• Book ID: 120516631
• Publisher: American Institute of Physics
• Year: 2009
• Tongue: English
• Weight: 430 KB
• Volume: 94
• Category: Article
• ISSN: 0003-6951
• DOI: 10.1063/1.3077310