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Electrochemically Deposited Copper Schottky Contacts on n-Type GaAs for Electron-Beam-Induced Current Measurements

✍ Scribed by Schlesinger, R. ;Rogaschewski, S. ;Janietz, P. J.


Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
552 KB
Volume
120
Category
Article
ISSN
0031-8965

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