<p><P>The book describes the basic principles that relate to field and current inhomogeneities in semiconductors and their kinetics that occur in the regime of negative differential conductances of semiconductors. The book presents the related theory and experiment. It proceeds to give for the first
Electro-Optical Effects to Visualize Field and Current Distributions in Semiconductors
β Scribed by Karl W. BΓΆer (auth.)
- Publisher
- Springer-Verlag Berlin Heidelberg
- Year
- 2010
- Tongue
- English
- Leaves
- 130
- Series
- Springer Series in Solid-State Sciences 162
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
β¦ Synopsis
The book describes the basic principles that relate to field and current inhomogeneities in semiconductors and their kinetics that occur in the regime of negative differential conductances of semiconductors. The book presents the related theory and experiment. It proceeds to give for the first time the experimental methods to observe directly these inhomogeneities within the semiconductor. It analyses in detail the different ranges in which such inhomogeneities occur, when they are stationary and when not and what technical and device application result.
The accompanying film on the website demonstrates all related kinetic effects. Information on these effects was previously mostly available indirectly by interpretation of current-voltage characteristics, or by point contact probing along the surface, or by changes in the luminescence spectrum. The material is based on the original papers of the research team of the author, starting in the late 50βs and updated to incl. 2008.
β¦ Table of Contents
Front Matter....Pages I-VIII
Introduction....Pages 1-6
High-Field Domains....Pages 7-29
Moving High-Field Domains....Pages 31-51
Negative Differential Conductivity Caused by Mobility....Pages 53-58
Negative Differential Conductivity in Other Materials....Pages 59-72
Current Channels....Pages 73-98
Back Matter....Pages 99-125
β¦ Subjects
Solid State Physics;Spectroscopy and Microscopy;Optical and Electronic Materials;Microwaves, RF and Optical Engineering
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