Electrically detected double electron–electron resonance: exchange interaction of P donors and P defects at the Si/SiO interface

✍ Scribed by Suckert, Max; Hoehne, Felix; Dreher, Lukas; Kuenzl, Markus; Huebl, Hans; Stutzmann, Martin; Brandt, Martin S.

• Book ID: 121710369
• Publisher: Taylor and Francis Group
• Year: 2013
• Tongue: English
• Weight: 590 KB
• Volume: 111
• Category: Article
• ISSN: 0026-8976
• DOI: 10.1080/00268976.2013.816796