Electrically and thermally stable gate dielectrics from thiol–ene cross-linked systems for use in organic thin-film transistors

✍ Scribed by Ko, Jung Min; Kang, Young Hun; Lee, Changjin; Cho, Song Yun

• Book ID: 120430156
• Publisher: The Royal Society of Chemistry
• Year: 2013
• Tongue: English
• Weight: 558 KB
• Volume: 1
• Category: Article
• ISSN: 2050-7526
• DOI: 10.1039/c3tc30297k