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Electrically active defects in detector-grade CdTe:Cl and CdZnTe materials grown by THM and HPBM

✍ Scribed by L. Chibani; M. Hage-Ali; P. Siffert


Publisher
Elsevier Science
Year
1996
Tongue
English
Weight
355 KB
Volume
161
Category
Article
ISSN
0022-0248

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