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Electrical Study of Thin SiO2 Layers Obtained by Anodic Oxidation of p-Type Silicon in Pure Water UsingI–U,C–U, andG–U Measurements

✍ Scribed by Morfouli, P. ;Pananakakis, G.


Book ID
105381044
Publisher
John Wiley and Sons
Year
1989
Tongue
English
Weight
544 KB
Volume
111
Category
Article
ISSN
0031-8965

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