✦ LIBER ✦
Electrical stability of multilayer MoS 2 field-effect transistor under negative bias stress at various temperatures
✍ Scribed by Yang, Suk; Park, Solah; Jang, Sukjin; Kim, Hojoong; Kwon, Jang-Yeon
- Book ID
- 124066167
- Publisher
- John Wiley and Sons
- Year
- 2014
- Tongue
- English
- Weight
- 578 KB
- Volume
- 8
- Category
- Article
- ISSN
- 1862-6254
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