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Electrical Resistivity Study of Lattice Defects Introduced in Copper by 1.25-Mev Electron Irradiation at 80°K

✍ Scribed by Meechan, C. J.; Brinkman, J. A.


Book ID
125814072
Publisher
The American Physical Society
Year
1956
Tongue
English
Weight
956 KB
Volume
103
Category
Article
ISSN
0031-899X

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