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Electrical resistivity of fully-relaxed grain boundaries in nanocrystalline Cu

✍ Scribed by L.H. Qian; Q.H. Lu; W.J. Kong; K. Lu

Book ID: 113894993
Publisher: Elsevier Science
Year: 2004
Tongue: English
Weight: 443 KB
Volume: 50
Category: Article
ISSN: 1359-6462
DOI: 10.1016/j.scriptamat.2004.02.026

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