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Electrical resistivity of carbon films

โœ Scribed by D.S. Kupperman; C.K. Chau; H. Weinstock


Publisher
Elsevier Science
Year
1973
Tongue
English
Weight
394 KB
Volume
11
Category
Article
ISSN
0008-6223

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โœฆ Synopsis


The electrical resistivity along 500 A thick carbon films has been measured from l-2 to 1100ยฐK. The electrical resistivity measurements at high temperature indicate a change in the structure of the film beginning at about 670ยฐK. In the theory of noncrystalline solids by Mott, the temperature dependence of the electrical conductivity o, at low temperature, is given by In o = A -BT-1'4 where A and B are constants. Whereas previous investigators have shown general agreement with Mott's relation, the present result at low temperature shows deviation from the In cr (Y T-II4 relation.


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Electrical resistivity and stoichiometry
โœ R.C. Haddon; G.P. Kochanski; A.F. Hebard; A.T. Fiory; R.C. Morris; A.S. Perel ๐Ÿ“‚ Article ๐Ÿ“… 1993 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 389 KB

Electrical resistance measurements show that uniform intercalation of Ba into Cm films is much more difficult to achieve than in the case of the other alkaline earths (AE), Ca and Sr. Ba,C,, films studied after annealing at 220ยฐC show a resistivity minimum between 1 <x<2, and another weak minimum at