Effects of annealing on structural, elec
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H. Karaagac; M. Parlak
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Article
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2009
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John Wiley and Sons
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English
โ 326 KB
๐ 2 views
The structural, electrical and optical properties of AgGa(Se 0.5 S 0.5 ) 2 thin films deposited by using the thermal evaporation method have been investigated as a function of annealing in the temperature range of 450-600 ยฐC. X-ray diffraction (XRD) analysis showed that the structural transformation