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Electrical resistance drift of molybdenum silicide thin film temperature sensors

✍ Scribed by C.H. Ho; Y.H.C. Cha; S. Prakash; G. Potwin; H.J. Doerr; C.V. Deshpandey; R.F. Bunshah; M. Zeller

No coin nor oath required. For personal study only.

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