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Electrical resistance at carbon nanotube/copper interfaces: Capped versus open-end carbon nanotubes

✍ Scribed by Feng Gao; Jianmin Qu; Matthew Yao

Book ID: 113796050
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 764 KB
Volume: 82
Category: Article
ISSN: 0167-577X
DOI: 10.1016/j.matlet.2012.05.095

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