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Electrical resistance and deformation during the stress-assisted two-way memory effect in Ni45Ti50Cu5 alloy

✍ Scribed by S. Colombo; C. Cannizzo; F. Gariboldi; G. Airoldi

Book ID: 116600154
Publisher: Elsevier Science
Year: 2006
Tongue: English
Weight: 929 KB
Volume: 422
Category: Article
ISSN: 0925-8388
DOI: 10.1016/j.jallcom.2005.12.016

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