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Electrical reliability and leakage mechanisms in highly resistive multiferroic La[sub 0.1]Bi[sub 0.9]FeO[sub 3] ceramics

✍ Scribed by S. Y. Wang; X. Qiu; J. Gao; Y. Feng; W. N. Su; J. X. Zheng; D. S. Yu; D. J. Li

Book ID: 121732739
Publisher: American Institute of Physics
Year: 2011
Tongue: English
Weight: 418 KB
Volume: 98
Category: Article
ISSN: 0003-6951
DOI: 10.1063/1.3580604

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