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Electrical relaxation and the strong-field effect when injection currents are present in metal-oxide-semiconductor systems

✍ Scribed by V. A. Laleko; L. L. Odynets; P. A. Raikerus


Book ID
112429357
Publisher
Springer
Year
1981
Tongue
English
Weight
313 KB
Volume
24
Category
Article
ISSN
1573-9228

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