Electrical property-microstructural defect relationship for oxide films formed on nickel during high-temperature oxidation

✍ Scribed by S.-H. Song; P. Xiao

• Book ID: 110295667
• Publisher: Springer
• Year: 2001
• Tongue: English
• Weight: 121 KB
• Volume: 20
• Category: Article
• ISSN: 0261-8028
• DOI: 10.1023/a:1010924811363