Electrical properties of Si4+substituted copper ferrite

✍ Scribed by B. L. Patil; S. R. Sawant; S. A. Patil; R. N. Patil

• Publisher: Springer
• Year: 1994
• Tongue: English
• Weight: 314 KB
• Volume: 29
• Category: Article
• ISSN: 0022-2461
• DOI: 10.1007/bf00356590

✦ Synopsis

The electrical resistivity, p, and Seebeck coefficient, a, for the system Cul +xSixFe2_2x04 (where x= 0.05, 011,0.15, 0.2 and 0.3) have been studied as a function of temperature. Temperature variation of the resistivity exhibits two breaks. Each break is associated with a change in activation energy. The conduction process at low temperature is governed by the reaction Cu~, + + Cu2+--,Cu~ + + Cu~ +. However, at higher temperature, it is due to intersite cation exchange and reoxidation such as CUA 2+ + Fe3B+-~Cu 2+ + Fe~ +. Measurement of the Seebeck coefficient, a, from room temperature to 800 K reveals n-type conduction for the sample with x = 0.05, while the measurements for other samples show p-type conduction for lower temperatures and n-type conduction at higher temperatures. The activation energies in the paramagnetic region are found to be less than those in the ferrimagnetic region.