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Electrical Properties of Pb0.92La0.08Zr0.52Ti0.48O3 Thin Films Grown on SrRuO3 Buffered Nickel and Silicon Substrates by Chemical Solution Deposition

โœ Scribed by Manoj Narayanan; Beihai Ma; Sheng Tong; Rachel Koritala; Uthamalingam Balachandran

Book ID
114840530
Publisher
John Wiley and Sons
Year
2012
Tongue
English
Weight
498 KB
Volume
aop
Category
Article
ISSN
1546-542X

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๐Ÿ“œ SIMILAR VOLUMES

Structural and electrical properties of
Structural and electrical properties of solโ€“gel deposited Pb(Zr0.92Ti0.08)O3 thin films doped with Nb
โœ L. Pintilie; I. Boerasu; M. Pereira; M.J.M. Gomes ๐Ÿ“‚ Article ๐Ÿ“… 2004 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 250 KB

Pb(Zr, Ti)O 3 (PZT) thin films with Zr/Ti ratio of 92/8 and doped with up to 4 at.% Nb were deposited by sol-gel on Pt coated Si substrates. The scope was to investigate the influence of Nb additive on the structural, optical and electrical properties of Zr-rich PZT phase. It was found that a residu