Electrical properties and degradation phenomena of glass-doped ZnO chip varistors

✍ Scribed by J.N. Lin; C.M. Lin; C.C. Kao; W.C. Chang

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 448 KB
• Volume: 20
• Category: Article
• ISSN: 0921-5107
• DOI: 10.1016/0921-5107(93)90238-i

✦ Synopsis

Several glass additives with compositions in the PbO-B203-ZnO-SiO 2 system were applied to multilayer type ZnO ceramic chip varistors which had been manufactured using the ceramic green-sheet lamination technique. Measurements of capacitance-voltage ( C-V ), current-voltage (I-V ) and degradation behavior, as well as microstructural observations, were performed. It was found that specimens into which the above-mentioned glasses were incorporated had good surgewithstanding capability, with the exception of samples including Zn-B-Si glass. The electrical properties of specimens deteriorated gradually with increasing glass content. The addition of glasses improved the thermal stability of ZnO varistors except for G4 glass-doped sample (60 w/oPbO-i 2w/oB203-6.5w/oSiO2-21.5w/oZnO). Stable varistors with good nonlinearity parameters were obtained by combining the glass compositions and other additives.