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Electrical properties and carrier transport mechanisms of nonvolatile memory devices based on randomly oriented ZnO nanowire networks

✍ Scribed by H. J. Wang; C. W. Zou; L. Zhou; C. X. Tian; M. K. Lee; J. C. Lee; T. W. Kang; D. J. Fu


Book ID
112183191
Publisher
John Wiley and Sons
Year
2011
Tongue
English
Weight
294 KB
Volume
5
Category
Article
ISSN
1862-6254

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