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Electrical modeling of interface roughness in thin film electroluminescent devices

✍ Scribed by Neyts, K.; De Visschere, P.M.J.; Soenen, B.; Stuyven, G.

Book ID: 114538028
Publisher: IEEE
Year: 2000
Tongue: English
Weight: 175 KB
Volume: 47
Category: Article
ISSN: 0018-9383
DOI: 10.1109/16.822275

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