Electrical methods for estimating the correlation length of insulator thickness fluctuations in MIS tunnel structures

✍ Scribed by S.E. Tyaginov; M.I. Vexler; A. El Hdiy; K. Gacem; V. Zaporojtchenko

• Book ID: 113810394
• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 443 KB
• Volume: 13
• Category: Article
• ISSN: 1369-8001
• DOI: 10.1016/j.mssp.2011.07.003