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Electrical Measurements and Optical Emission Spectroscopy of Silicon–Carbon Alloys Grown by PACVD: Correlation with Film Microstructure

✍ Scribed by L. Thomas; E. Tomasella; J.M. Badie; R. Berjoan; M. Ducarroir


Publisher
John Wiley and Sons
Year
2003
Tongue
English
Weight
443 KB
Volume
9
Category
Article
ISSN
0948-1907

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