Electrical degradation of n-Si/PtSi/(TiW)/Al Schottky contacts induced by thermal treatments

✍ Scribed by C. Canali; F. Fantini; E. Zanoni

• Publisher: Elsevier Science
• Year: 1982
• Tongue: English
• Weight: 472 KB
• Volume: 97
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(82)90524-7