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Electrical conduction and dielectric breakdown in aluminum oxide insulators on silicon

โœ Scribed by Kolodzey, J.; Chowdhury, E.A.; Adam, T.N.; Guohua Qui; Rau, I.; Olowolafe, J.O.; Suehle, J.S.; Yuan Chen


Book ID
114538001
Publisher
IEEE
Year
2000
Tongue
English
Weight
190 KB
Volume
47
Category
Article
ISSN
0018-9383

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