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Electrical characterization of SbSel grown from the melt by the vertical Bridgman technique

✍ Scribed by L. Palaniappan; F. D. Gnanam; P. Ramasamy

Publisher
Springer
Year
1987
Tongue
English
Weight
96 KB
Volume
6
Category
Article
ISSN
0261-8028

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## Abstract ZnO crystals grown by the vertical Bridgman technique were comprehensively characterized in view of the impurities and intrinsic defects in the material. It is shown that residual Al is the cause of the residual n‐type conductivity and intrinsic defects play only a minor role in the sam