Electrical characterization of multilayered SiC nano-particles for application as tunnel barrier engineered non-volatile memory

✍ Scribed by Dong Uk Lee; Eun Kyu Kim; Goon-Ho Park; Won-Ju Cho

• Publisher: Elsevier Science
• Year: 2010
• Tongue: English
• Weight: 1019 KB
• Volume: 42
• Category: Article
• ISSN: 1386-9477
• DOI: 10.1016/j.physe.2009.12.026