Electrical characterization of hole transport in heavily-doped shallow implanted emitters : Y. Pan. Solid-State Electronics35(9), 1253 (1992)

• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 109 KB
• Volume: 33
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(93)90238-t