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Electrical characterization of DNA in mechanically controlled break-junctions

✍ Scribed by Kang, N; Erbe, A; Scheer, E

Book ID
111859515
Publisher
Institute of Physics
Year
2008
Tongue
English
Weight
935 KB
Volume
10
Category
Article
ISSN
1367-2630

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In the conventional tunneling picture, the dependence of the tunnel resistance on the distance between two electrodes in vacuum is expected to be exponential. We have observed, however, clear deviations from this behavior over four to six orders of magnitude of the tunnel resistance at constant bias