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Electrical characterization of charges in irradiated oxides by electrostatic force microscopy and Kelvin method

✍ Scribed by H. Dongmo; J.F. Carlotti; G. Bruguier; C. Guasch; J. Bonnet; J. Gasiot

Book ID: 108418031
Publisher: Elsevier Science
Year: 2003
Tongue: English
Weight: 373 KB
Volume: 212-213
Category: Article
ISSN: 0169-4332
DOI: 10.1016/s0169-4332(03)00134-x

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