✦ LIBER ✦
Electrical characterization and reliability study of integrated GaN power amplifier in multi-layer thin-film technology
✍ Scribed by R. Liu; D. Schreurs; W. De Raedt; F. Vanaverbeke; J. Das; R. Mertens; I. De Wolf
- Book ID
- 113800508
- Publisher
- Elsevier Science
- Year
- 2011
- Tongue
- English
- Weight
- 681 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0026-2714
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