✦ LIBER ✦
Electrical characterization and reliability of double-doped drain MOS transistors compatible with an EEPROM process
✍ Scribed by Paolo Pavan; Enrico Zanoni; Lorenzo Fratin; Carlo Riva; Bruno Vajana
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 784 KB
- Volume
- 24
- Category
- Article
- ISSN
- 0026-2692
No coin nor oath required. For personal study only.