๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

Electrical characteristics of the SiO2-Si interface near midgap and in weak inversion : J. A. Cooper and Schwartz. Solid St. Electron.17, 641 (1974)


Publisher
Elsevier Science
Year
1975
Tongue
English
Weight
240 KB
Volume
14
Category
Article
ISSN
0026-2714

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES